Graphene and Semiconductors

Gilbert Chahine is a Research-Engineer at the CNRS and working on the BM02 beamline at the European Synchrotron (ESRF) in Grenoble France. After a PhD in Materials Science with the highest distinction degree at the CEA in France, during his Post-doc he developed a new x-ray imaging technique (KMap) along with user-friendly software for the analysis of 5D data sets. This technique is now highly requested by a large community of researchers form international institutes to perform new types of experiments such as in situ and operando strain imaging, with the highest available resolution, of nano devices for photonics, photo voltaics and optoelectronics. Besides coordinating several projects involving international academic and industrial institutions in the field of strained semiconductors, he became interested in adapting the latest advances in synchrotron x-ray sources for a direct model-free in-depth probe of 2D materials’ local structure for a better understanding of their properties.